Transmission Electron Microscopes


Instruments
	Transmission Electron Microscopes
	Scanning Electron Microscopes
	Confocal and Light Microscopy
	Scanning Probe Microscope
	Specimen Preparation Facilities

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Philips CM200 TEM

The Philips CM200 TEM is equipped with an Oxford Instruments thin–window X–ray detector and Link ISIS 300 microanalysis system with digital beam control for high spatial resolution elemental analysis and X–ray mapping of thin specimens.

For further details please contact Dr Thor Bostrom (t.bostrom@qut.edu.au).

JEOL 1200EX TEM

The JEOL1200 TEM operates at up to 120kV, and is fitted with a standard tungsten filament. It is used for general TEM examination especially of biological specimens. The instrument is equipped with a scanning transmission (STEM) system, and a Gatan 626 cryotransfer holder is also available for this TEM.