Scanning Electron Microscopes


Instruments
	Transmission Electron Microscopes
	Scanning Electron Microscopes
	Confocal and Light Microscopy
	Scanning Probe Microscope
	Specimen Preparation Facilities

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FEI Quanta 200 Environmental SEM

This SEM can operate at high vacuum as a conventional SEM, or in environmental mode using a low vacuum in the specimen chamber. Using the Quanta 200 in environmental mode allows hydrated or poorly conducting samples to be examined directly without the need for dehydration or conductive coating. This microscope is equipped with a Peltier–cooled stage and a heating stage for ESEM operation. It also has an EDAX thin–window X–ray detector and microanalysis system for elemental analysis and X–ray mapping.

JEOL 840A Electron Probe Microanalyser

The JEOL 840 is an SEM optimised for quantitative X–ray microanalysis of bulk samples, to a spatial resolution of approximately 1µm. This instrument is equipped with a JEOL thin window X–ray detector and JED–2300 microanalysis system for energy–dispersive microanalysis (EDX), and 3 wavelength–dispersive X–ray spectrometers and an optical microscope for WDS analysis operated through a Moran Scientific microanalysis system. It is also fitted with a Meeco ImageSlave digital image acquisition system for high quality secondary and backscattered electron images.